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Advancing miniaturization shapes our modern, high-tech world. The design complexity of electronic components and the heterogeneity of new materials constantly increase with decreasing device sizes. New-engineered products need to secure a high level of reliability, sustainability, and longevity to meet the international quality standards. Detection and classification of nanometer-sized material defects require characterization methods with a resolution in the nanometer range.

Are you experiencing similar challenges in your daily work? Join us on July 1, 2021!

This symposium gathers the professionals from the electronic industry to discuss innovative testing methods and tools for failure analysis of the future.

The program will include keynote talks ranging from case studies in the semiconductor device applications, innovative methods and tools for material characterization and defect review, emerging applications in the electronic industry up to future methods for increasing line productivity, efficiency, and yield. The symposium is going to be held as a virtual event. Access is free of charge.

Eventdatum: Donnerstag, 01. Juli 2021 14:00 – 18:00

Eventort: Online